Image of the Week Gallery
AFM of FIB Deposited Pt
Media Details
Created 10/22/2002 5:00:00 AM
Focused Ion Beam assisted Pt deposition on Si by varying the dwell time of the beam on individual pixels on a pattern created in Adobe Illustrator
Credits
- Soma Chattopadhyay , Beckman Institute
- Paul Bohn , Beckman Institute
Visualization Laboratory
Beckman Institute room 2203
405 North Mathews Avenue, Urbana, IL
(217) 300-0566